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ADE7753
V DD
V DD
I
10 μ F
100nF
100nF
10 μ F
I
10 μ F
100nF
100nF
1 0 μ F
U1
ADE7753
U1
ADE7753
di/dt CURRENT
SENSOR
100 Ω
33nF
100 Ω
33nF
1k Ω
33nF
1k Ω
33nF
AVDD DVDD RESET
DIN
V1P
DOUT
SCLK
V1N
CS
TO SPI BUS
(USED ONLY FOR
CALIBRATION)
CURRENT
TRANSFORMER
1k Ω
33nF
RB
1k Ω
33nF
AVDD DVDD RESET
DIN
V1P
DOUT
SCLK
V1N
CS
TO SPI BUS
(USED ONLY FOR
CALIBRATION)
110V
1k Ω
600k Ω
1k Ω
33nF
33nF
V2N
V2P
CLKOUT
CLKIN
IRQ
SAG
ZX
Y1 22pF
3.58MHz
22pF
NOT CONNECTED
110V
1k Ω
600k Ω
1k Ω
33nF
33nF
V2N
V2P
CLKOUT
CLKIN
IRQ
SAG
Y1 22pF
3.58MHz
22pF
NOT CONNECTED
10 μ F 100nF
CHANNEL 1 GAIN = 8
CHANNEL 2 GAIN = 1
REF IN/OUT
CF
AGND DGND
U3
PS2501-1
TO
FREQUENCY
COUNTER
02875-A-012
10 μ F 100nF
CT TURN RATIO = 1800:1
CHANNEL 2 GAIN = 1
GAIN 1 (CH1) RB
1 10 Ω
8 1.21 Ω
ZX
REF IN/OUT
CF
AGND DGND
U3
PS2501-1
TO
FREQUENCY
COUNTER
02875-0-030
Figure 29. Test Circuit for Performance Curves with Integrator On
Rev. C | Page 15 of 60
Figure 30. Test Circuit for Performance Curves with Integrator Off
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